Novel Dielectric Diagnostics Method for Materials for New Generation of High-Performance Capacitors

High-voltage capacitors play a critical role in ensuring stability and efficiency within modern electrical power systems. However, the materials used in these capacitors often encounter significant challenges under extreme conditions, including high electric fields and temperature fluctuations. This project seeks to develop an innovative diagnostic method to effectively characterize these materials under such harsh conditions, ultimately leading to the enhancement of material performance and the creation of the next generation of high-performance capacitors.

 

Project Overview

High-voltage capacitors are crucial for maintaining stability and efficiency in modern power systems. They filter high-frequency content from power electronics, improve power quality, reduce harmonic distortion, and contribute to power factor correction and energy storage. However, the dielectric materials in these capacitors, typically polymer-based films, face significant challenges under extreme conditions, such as high electric fields and temperature fluctuations, which can impact their performance and reliability. By considering environments with high electric fields and temperature variations, the project focuses on improving the reliability and efficiency of high-voltage capacitors and facilitating the development of the next generation of high-performance capacitors to meet the demanding requirements of the modern power system.

The Problem

Current diagnostic methods, such as dielectric frequency response (DFR), are inadequate because they don't replicate the extreme conditions dielectric materials face in operation. Traditional tests use electric fields much lower than those in real-world applications, which can exceed several hundred kV/mm. Moreover, these methods often fail to simulate the broad temperature ranges these materials endure, resulting in an incomplete understanding of their performance. This gap increases the risk of capacitor failure, potentially compromising the reliability of power grids.

Project Goal

This project aims to develop an advanced diagnostic method and test facilities to accurately assess dielectric materials under conditions that closely replicate real-world environments. By measuring the dielectric response across a wide range of electric fields and temperatures, this approach will offer deeper insights into material behavior under combined electrical and thermal stresses. The objective is to create a high-voltage, high-temperature DFR measurement technique suitable for both laboratory research and industrial applications. This characterization development will support the next generation of high-performance capacitors with improved energy density and reliability.

Conclusion

This project will enhance the reliability and performance of high-voltage capacitors by developing advanced diagnostic methods. These improvements will drive the innovation of next-generation capacitors, contributing to more stable and efficient power grids that can meet the growing demands of modern energy systems.

Involved in the project

Chalmers: Daniel Svensson (PhD student), Assoc. Prof. Thomas Hammarström (main supervisor), Dr. Xiangdong Xu (co-supervisor), Prof. Yuriy Serdyuk (examiner for PhD student, project coordinator), Prof. Stanislaw Gubanski (member of the Reference group). 

Hitachi Energy: Dr. Olof Hjortstam (industrial co-supervisor, Adj. Prof. at EPE Chalmers), Dr. Sari Laihonen (member of the Reference group), Dr. Riddhi Ghosh (member of the Reference group)

Partners 

Hitachi Energy

Funders

Swedish Energy Agency, Hitachi Energy, Chalmers University of Technology